Their main features are:
Photodiodes are very similar to rectifying junction diodes, and are manufactured as p-n Si or GaAsP photodiodes, PIN Si photodiodes, GaAsP Schottky and Si avalanche photodiodes. The p layer is at the light sensitive surface, and the n-side at the substrate. An avalanche photodiode is obtained by adding to a simple PIN diode an electron multiplication region, viz. an area with large bias voltage generating secondary electrons and holes. This process multiplies the signal (and primary shot noise), and adds stochastic noise for the multiplication process; they are not suited for single-photon readout. Depending on the bias voltage, a proportional mode (allowing one to measure light intensity) or a Geiger mode (giving a larger, saturated signal) can be achieved. An application for scintillating fibre tracking has been discussed in [Nonaka96].
For an overview, see [Kazovsky96]. The radiation hardness of photodiodes has been studied in parallel with semiconductor detectors ( [Hall90]).